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TA27B
Test Adapter TA 27 B is a
modernized adapter of former
M3000 TA
07 B family test adapter
for UNIMET test system.
TA 27 B is also expandable with
Avalanche test adapter
Testing
• Bipolar transistor
(NPN, PNP, Low power, Darlington)
• Field effect transistors
(N-channel, P-channel, Power-MOS)
• Diodes
• Zener diodes
• Arrays
• 2 000 V optional
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| Parameters
- Diodes & Zenner Diodes |
| Forward
voltage |
VF |
| Reverse
voltage |
VR |
| Zenner
voltage |
VZ |
| Reverse
leakage current |
IR |
| Dynamic
resistance DC |
Rdyn |
| Dynamic
resistence AC |
Rz |
| Parameters
- Bipolar Transistor |
| Breakdown
voltage |
VCEO(BR) |
| Breakdown
voltage |
VCES(BR) |
| Sutaration
voltage |
VCE(sat) |
| Sutaration
voltage |
VBE(sat) |
| Breakdown
voltage |
VCBO |
| Breakdown
voltage |
VEBO |
| Diode
forward voltage |
VF(diode) |
| Collector/Emitter
cut off voltage |
ICEO,ICBO,IEBO |
| On
voltage |
VBE(on) |
| DC
current gain |
hfe(DC) |
| AC
current gain |
H21e(AC) |
| Parameters
- MOS-FETs |
| Breakdown
voltage |
V(BR)DSS |
| Inverse
diode voltage |
VSD |
| Gate
threshold voltage |
VGS |
| On
resistance |
RDS(on) |
| Forward
transconductance |
gfs |
| Forward/Reverse
leakage current |
IGSS |
| On
voltage |
VDS(on) |
| On-state
drain current |
ID(on) |
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